JOPSS - Search Results

Search Results: Records 1-6 displayed on this page of 6

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JAEA Reports

Analyses of plasma parameter profiles in JT-60U

Shirai, Hiroshi; Shimizu, Katsuhiro; Hayashi, Nobuhiko; Itakura, Hirofumi*; Takase, Keizo*

JAERI-Data/Code 2000-040, 214 Pages, 2001/01

JAERI-Data-Code-2000-040.pdf:7.89MB

no abstracts in English

JAEA Reports

Outline and handling manual of experimental data time slice monitoring software SLICE

Shirai, Hiroshi; Hirayama, Toshio; Shimizu, Katsuhiro; Tani, Keiji; Azumi, Masafumi; Hirai, Kenichiro*; Konno, Satoshi*; Takase, Keizo*

JAERI-M 93-026, 97 Pages, 1993/02

JAERI-M-93-026.pdf:2.77MB

no abstracts in English

Journal Articles

Identification of small point defect clusters by high resolution electron microscopy

; Izui, Kazuhiko

Point Defects and Defect Interactions in Metals, p.705 - 707, 1982/00

no abstracts in English

JAEA Reports

Aseismic Analysis of Vertical Two-Dimensonal VHTR Core with Simpliefied Model

;

JAERI-M 9075, 32 Pages, 1980/09

JAERI-M-9075.pdf:0.88MB

no abstracts in English

Journal Articles

Electron optical conditions for the formation of structure images of silicon oriented in (110)

Japanese Journal of Applied Physics, 19(5), p.799 - 806, 1980/00

https://doi.org/10.1143/JJAP.19.799

Times Cited Count：3 Percentile：20.69(Physics, Applied)

no abstracts in English

Journal Articles

Crystal structure images of silicon at some elevated voltages

; Izui, Kazuhiko; ; ; *

Proc.5th Int.Conf.on High Voltage Electron Microscopy, p.301 - 304, 1977/08

no abstracts in English